Equipment
Electron Microscope
| equipment | Model | Accelerating voltage | XEDS | EELS | ||
|---|---|---|---|---|---|---|
| TEM ／ STEM |
High Voltage TEM | JEM-1300NEF | 400,600,800,1000,1200 | 〇 | Ω | |
| New ARM STEM/TEM | JEM-ARM300F2 | 80, 200, 300 | 〇 | × | ||
| Atomic Resolution Analytical TEM | JEM-ARM200CF | 30, 60, 80, 120, 200 | 〇 | GIF | ||
| Cs-Corrected STEM/TEM | JEM-ARM200F | 60, 80, 120, 200 | 〇 | GIF | ||
| Conventional STEM/TEM | JEM-2100F | 120, 160, 200 | 〇 | × | ||
| TEM | Holography TEM | HF-3300X | 100-300 | × | GIF | |
| Conventional TEM | JEM-2100HC | 100,120,200 | × | × | ||
| SEM | Micro-Calorimeter FESEM | TES+ULTRA55 | 0.1-30 | 〇 | × |
Sample preparation equipment
| equipment | function |
|---|---|
| Helios 5 UX | TEM sample preparation / 3D-SEM ／ EBSD ／ Air-Free Transfer ／ Auto TEM sample prep. |
| MI4000L | TEM sample preparation / 3D-SEM |
| Quanta 3D 200i | Samples can be extracted from the necessary location in the sample |
| GATAN PIPSⅡ M-695 | Preparation of disk-shaped electron microscope sample / Low-angle ion irradiation / Polishing with low acceleration voltage |
| Fischone NanoMill Model1040 | Preparation of sample with little damage layer / Removal of damage layer produced due to FIB polishing |
| JEOL Ionslicer EM-09100 IS | Preparation of thin-film sample via Ar ion irradiation / Enables conversion of wide visual field to a thin film |
| BUEHLER Isomet 11-1280-170 | Cutting of bulk samples |
| Gatan Model 601 | Cutting out a 3 mmφ disk from a sheet sample |
| Gatan NISSEI Model 656N | Making depressions in a 3 mmφ disk-shaped sample / Pre-treatment for Ar-ion polishing |
| VCR GROUP Incorporated D500i | |
| SolarusⅡ Gatan Model 955 |
Contamination reduction with the use of RF plasma |
| SANYU SVC-700TURBO-TM | Sample preparation using vacuum deposition / Surface coating / Cleaning of TEM apertures, etc. |
| JEC 560 | Pre-treatment for TEM-SEM observation of insulator sample |
| EC 32010CC | |
| JFC 1600 | Prevention of electrostatic charge by coating the surface of an insulation sample with carbon |
| DⅡ-29020HD | Prevention of electrostatic charge by coating the surface of an insulation sample with metal Hydrophilization of the surface of TEM grids / Hydrophilization of sample support stand for SEM Hydrophilization of diamond knife (for ultramicrotomy) |
Electron microscope peripheral equipment
Image recording / reproduction
| equipment | model | purpose | |
|---|---|---|---|
| Imaging Plate Reader | DITABIS micron | Reading device for high dynamic range images recorded on imaging plates | dynamic range：5digit |
Image analysis, data analysis software
| software | function | |
|---|---|---|
| Mac Tempas X | Mac | Simulations of high-resolution electron microscope images and electron diffraction patterns |
| Crystal Kit | Mac | Drawing crystal structures |
| jems | Dell, HP | Simulations of high-resolution electron microscope images and (convergent) electron diffraction patterns |
| ICDD View 2018 | EPSON(Endeavor) | Database of crystallography, JCPDS(Electron diffraction patterns are available) |
| Crystal Maker, Crystal diffract |
EPSON(Endeavor) | Drawing crystal structures |
| Crystal Studio | EPSON(Endeavor) | Drawing crystal structures |
| Temography | EPSON(Endeavor) | Tomographic reconstruction of 3D structures and visualization |
| Inspect3D | EPSON(Endeavor) | Tomographic reconstruction of 3D structures |
| Amira | EPSON(Endeavor) | Tomographic reconstruction of 3D structures and visualization |
| Composer, Visualizerkai 64bit |
EPSON(Endeavor) | Tomographic reconstruction of 3D structures and visualization |