High Voltage TEM
High Voltage TEM
JEM-1300NEF
The Ultra high voltage transmission electron microscope allows observations in micrometer-order-thick specimens and also 3D tomography. As well as high resolution imaging, by using the Omega-type energy-filter and SDD XEDS detector, observations of chemical compositions and bonding states are available.
| Installation location | ITO Campus・CE20 | |
|---|---|---|
| Accelerating voltage | 400,600,800,1000,1200 | |
| Emission Gun | LaB6 | |
| TEM resolution(nm) | 0.12 point 0.10 lattice |
|
| STEM | minimum probe diameter | 1.6 nm |
| HAADF | － | |
| ABF | － | |
| XEDS | type | SDD |
| solid angle | 0.07 sr | |
| energy resolution | 130 eV | |
| EELS | Ω | |
| 3D tomography | ○ | |
| Sample inclination angle | X:±70 Y:±20 |
|
| Convergent electron diffraction | △ | |