Lorenz TEM
Lorenz TEM
TECNAI G2-F20
With a magnetic field-free Lorentz lens, this analytical transmission electron microscope is capable to observe magnetic domains and their dynamic behavior in magnetic materials at a direct magnification of 44000x. The bright Schottky FEG allows BF- and HAADF-STEM observation also with automated 3D tomography and elemental mapping using the Si(Li) XEDS detector.
| Installation location | Chikushi Campus | |
|---|---|---|
| Accelerating voltage | 100-200 | |
| Emission Gun | T-FEG*¹ | |
| TEM resolution(nm) | 0.24 point | |
| STEM | minimum probe diameter | 0.3 nm |
| HAADF | 〇 | |
| ABF | ||
| XEDS | type | Si(Li) |
| solid angle | 0.13 sr | |
| energy resolution | ||
| EELS | － | |
| 3D tomography | ○ | |
| Sample inclination angle | X:±80 Y:±30 |
|
| Convergent electron diffraction | 〇 | |